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From Edges to Domain Walls: Quantum Materials Under Scrutiny by Nanoscale Microwave Imaging

Thursday, March 2, 2017
12:00 PM - 1:00 PM
Location: Keck 142
Eric Yue Ma, Department of Applied Physics, Stanford University

Interfaces and boundaries in quantum materials have limitless potential for realizing novel physical properties. In the past few decades this potential has motivated rapid development of advanced characterization tools, which in turn led to more surprising discoveries. Among these tools is the Microwave Impedance Microscopy (MIM), which uses a localized microwave field to non-invasively probe the electronic properties of materials at the nanoscale. In this seminar I will first give an introduction to MIM, followed by multiple relevant applications exploring mesoscopic heterogeneities in quantum materials. I will then focus on a recent work in which we used MIM to identify the first insulating magnetic material with metallic magnetic domain walls.

Series: Applied Physics Seminar Series
For more information, please phone 626-395-3982 or email mrodriguez@caltech.edu

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